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1

[IEEE 2012 IEEE International Symposium on Electromagnetic Compatibility - EMC 2012 - Pittsburgh, PA, USA (2012.08.6-2012.08.10)] 2012 IEEE International Symposium on Electromagnetic Compatibility - Prediction of common-mode current reduction using ferrites in systems with cable harnesses

Bondarenko, Natalia, Shao, Peng, Orlando, Andrea, Koledintseva, Marina Y., Beetner, Daryl G., Berger, Phil

Year:

2012

Language:

english

File:

PDF, 639 KB

english, 2012

2

[IEEE 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Singapore (2018.5.14-2018.5.18)] 2018 IEEE International Symposium on Electromagnetic Compatibility and 2018 IEEE Asia-Pacific Symposium on Electromagnetic Compatibility (EMC/APEMC) - Prediction of common mode current in cable harnesses

Makharashvili, Tamar, Walunj, Sameer Arun, He, Ruijie, Booth, Brian, Martin, Kerry, Hwang, Chulsoon, Beetner, Daryl G.

Year:

2018

Language:

english

File:

PDF, 394 KB

english, 2018

3

[IEEE 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Reno, NV, USA (2020.7.28-2020.8.28)] 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Trend Analysis of Dissipated Electrostatic Discharge Energy in Touchscreen Displays

Peng, Zhekun, Marathe, Shubhankar, Rezaei, Hossein, Maghlakelidze, Giorgi, Pommerenke, David, Foudazi, Ali, Lam, Cheung-Wei, Beetner, Daryl, Kim, DongHyun

Year:

2020

File:

PDF, 1.89 MB

2020

4

[IEEE 2002 International Symposium on Electromagnetic Compatibility - Minneapolis, MN, USA (19-23 Aug. 2002)] IEEE International Symposium on Electromagnetic Compatibility - An expert system architecture to detect system-level automotive EMC problems

Ranganathan, S., Beetner, D.G., Wiese, R., Hubing, T.H.

Year:

2002

Language:

english

File:

PDF, 346 KB

english, 2002

5

[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Reduction of noise in near-field measurements

Osterwise, C, Grant, S L, Beetner, D

Year:

2010

Language:

english

File:

PDF, 1.39 MB

english, 2010

6

[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - A lumped-element circuit model of ferrite chokes

Orlando, A, Koledintseva, M Y, Beetner, D G, Peng Shao,, Berger, P

Year:

2010

Language:

english

File:

PDF, 951 KB

english, 2010

7

[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - Modeling timing variations in digital logic circuits due to electrical fast transients

Gao, Xu, Sui, Chunchun, Beetner, Daryl, Hemmady, Sameer, Rivera, Joey, Yakura, Susumu, Villafuerte, Julio, Pommerneke, David

Year:

2013

Language:

english

File:

PDF, 998 KB

english, 2013

8

[IEEE 2013 IEEE International Symposium on Electromagnetic Compatibility - EMC 2013 - Denver, CO, USA (2013.08.5-2013.08.9)] 2013 IEEE International Symposium on Electromagnetic Compatibility - Estimating the radiated emissions from cables attached to a switching power supply in a MIL-STD 461 test

Li, Guang-Hua, Qian, Wei, Radchenko, Andriy, Hess, Gary, Hoeckele, Robert, Jalbert, Pete, Van Doren, Thomas, Pommerenke, David, Beetner, Daryl

Year:

2013

Language:

english

File:

PDF, 749 KB

english, 2013

9

A Measurement-Based Model of the Electromagnetic Emissions From a Power Inverter

Bondarenko, Natalia, Li Zhai,, Bingjie Xu,, Guanghua Li,, Makharashvili, Tamar, Loken, David, Berger, Phil, Van Doren, Thomas P., Beetner, Daryl G.

Journal:

IEEE Transactions on Power Electronics

Year:

2015

Language:

english

File:

PDF, 1.03 MB

english, 2015

10

[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Validation of Worst-Case and Statistical Models for an Automotive EMC Expert System

Beetner, Daryl, Weng, Haixiao, Wu, Meilin, Hubing, Todd

Year:

2007

Language:

english

File:

PDF, 259 KB

english, 2007

11

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - A preliminary study of maximum system-level crosstalk at high frequencies for coupled transmission lines

Dong, X., Weng, H., Beetner, D.G., Hubing, T., Wiese, R., McCallum, J.

Year:

2004

Language:

english

File:

PDF, 237 KB

english, 2004

12

[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Rapid simulation of the statistical variation of crosstalk in cable harness bundles

Xiang Li,, Meilin Wu,, Beetner, D, Hubing, T

Year:

2010

Language:

english

File:

PDF, 728 KB

english, 2010

13

Statistical Prediction of “Reasonable Worst-Case” Crosstalk in Cable Bundles

Wu, Meilin, Beetner, Daryl G., Hubing, Todd H., Ke, Haixin, Sun, Shishuang

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2009

Language:

english

File:

PDF, 1.21 MB

english, 2009

14

[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Estimation of the statistical variation of crosstalk in wiring harnesses

Wu, Meilin, Beetner, Daryl, Hubing, Todd, Haixin Ke,, Sun, Shishuang

Year:

2008

Language:

english

File:

PDF, 366 KB

english, 2008

15

[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Mode Suppressed TEM Cell Design For High Frequency IC Measurements

Deng, Shaowei, Pommerenke, David, Hubing, Todd, Drewniak, J., Beetner, Daryl, Shin, Dongshik, Kim, Sungnam, Kwak, Hocheol

Year:

2007

Language:

english

File:

PDF, 455 KB

english, 2007

16

Fabrication of Two-Layer Thin-Film Magnetic-Field Microprobes on Freestanding SU-8 Photoepoxy

Reck, J.N., Kuifeng Hu,, Shaohua Li,, Haixiao Weng,, Beetner, D.G., O'Keefe, M.J., Ramsay, D.S., Drewniak, J.L.

Journal:

IEEE Transactions on Device and Materials Reliability

Year:

2010

Language:

english

File:

PDF, 994 KB

english, 2010

17

[IEEE 2007 IEEE International Symposium on Electromagnetic Compatibility - Honolulu, HI, USA (2007.07.9-2007.07.13)] 2007 IEEE International Symposium on Electromagnetic Compatibility - Development and Application of a High-Resolution Thin-Film Probe

Li, Shaohua, Hu, Kuifeng, Beetner, Daryl, Drewniak, J., Reck, James, O'Keefe, Matt, Wang, Kai, Dong, Xiaopeng, Slattery, Kevin

Year:

2007

Language:

english

File:

PDF, 420 KB

english, 2007

18

[IEEE Comput. Soc 1999 IEEE International Conference on Microelectronics Systems Education (MSE'99) - Arlington, VA, USA (19-21 July 1999)] Proceedings 1999 IEEE International Conference on Microelectronic Systems Education (MSE'99) 'Systems Education in the 21st Century' (Cat. No.99-63794) - Hardware-software co-verification in an undergraduate laboratory

Pottinger, H.J., Beetner, D.

Year:

1999

Language:

english

File:

PDF, 13 KB

english, 1999

19

[IEEE 2010 IEEE International Symposium on Electromagnetic Compatibility - EMC 2010 - Fort Lauderdale, FL (2010.07.25-2010.07.30)] 2010 IEEE International Symposium on Electromagnetic Compatibility - Modeling of the immunity of ICs to EFTs

Ji Zhang,, Jayong Koo,, Beetner, Daryl G, Moseley, Richard, Herrin, Scott, Pommerenke, David

Year:

2010

Language:

english

File:

PDF, 1.26 MB

english, 2010

20

[IEEE 2008 IEEE International Symposium on Electromagnetic Compatibility - EMC 2008 - Detroit, MI (2008.08.18-2008.08.22)] 2008 IEEE International Symposium on Electromagnetic Compatibility - Time synchronized near-field and far-field for EMI source identification

Gang Feng,, Wei Wu,, Pommerenke, David, Fan, Jun, Beetner, Daryl G.

Year:

2008

Language:

english

File:

PDF, 250 KB

english, 2008

21

[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Predicting TEM cell measurements from near field scan data

Haixiao Weng,, Beetner, D.G., DuBroff, R.E.

Year:

2006

Language:

english

File:

PDF, 326 KB

english, 2006

22

[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Application of chip-level EMC in automotive product design

Hu, K., Weng, H., Beetner, D., Pommerenke, D., Drewniak, J., Lavery, K., Whiles, J.

Year:

2006

Language:

english

File:

PDF, 623 KB

english, 2006

23

[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Development and validation of a microcontroller model for EMC

Li, Shaohua, Bishnoi, Hemant, Whiles, Jason, Ng, Pius, Weng, Haixiao, Pommerenke, David, Beetner, Daryl

Year:

2008

Language:

english

File:

PDF, 378 KB

english, 2008

24

[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Matched filter detection and identification of electronic circuits based on their unintentional radiated emissions

Shaik, A., Haixiao Weng,, Xiaopeng Dong,, Hubing, T.H., Beetner, D.G.

Year:

2006

Language:

english

File:

PDF, 432 KB

english, 2006

25

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Determination of high frequency package currents from near-field scan data

Xiaopeng Dong,, Shaowei Deng,, Beetner, D.G., Hubing, T.H., Van Doren, T.P.

Year:

2005

Language:

english

File:

PDF, 689 KB

english, 2005

26

[IEEE 2011 IEEE International Symposium on Electromagnetic Compatibility - EMC 2011 - Long Beach, CA, USA (2011.08.14-2011.08.19)] 2011 IEEE International Symposium on Electromagnetic Compatibility - Modelling electromagnetic field coupling from an ESD gun to an IC

Zhang, Ji, Beetner, Daryl G, Moseley, Richard, Herrin, Scott, Pommerenke, David

Year:

2011

Language:

english

File:

PDF, 1.43 MB

english, 2011

27

A Nonlinear Microcontroller Power Distribution Network Model for the Characterization of Immunity to Electrical Fast Transients

Koo, Jayong, Han, Lijun, Herrin, Scott, Moseley, Richard, Carlton, Ross, Beetner, Daryl G., Pommerenke, David

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2009

Language:

english

File:

PDF, 1.30 MB

english, 2009

28

Modeling Static Delay Variations in Push–Pull CMOS Digital Logic Circuits Due to Electrical Disturbances in the Power Supply

Gao, Xu, Sui, Chunchun, Hemmady, Sameer, Rivera, Joey, Yakura, Susumu Joe, Pommerenke, David, Patnaik, Abhishek, Beetner, Daryl G.

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2015

Language:

english

File:

PDF, 931 KB

english, 2015

29

[IEEE 2004 International Symposium on Electromagnetic Compatibility - Silicon Valley, CA, USA (9-13 Aug. 2004)] 2004 International Symposium on Electromagnetic Compatibility (IEEE Cat. No.04CH37559) - Analysis of chip-level EMI using near-field magnetic scanning

Dong, X., Deng, S., Hubing, T., Beetner, D.

Year:

2004

Language:

english

File:

PDF, 487 KB

english, 2004

30

[IEEE 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Taipei, Taiwan (2015.5.26-2015.5.29)] 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Predicting EMI induced delay errors in integrated circuits: Sensitivity to the velocity saturation index

Gao, Xu, Sui, Chunchun, Hemmady, Sameer, Rivera, Joey, Andivahis, Lisa, Pommerenke, David, Beetner, Daryl

Year:

2015

Language:

english

File:

PDF, 845 KB

english, 2015

31

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Neural network detection and identification of electronic devices based on their unintended emissions

Haixiao Weng,, Xiaopeng Dong,, Xiao Hu,, Beetner, D.G., Hubing, T., Wunsch, D.

Year:

2005

Language:

english

File:

PDF, 233 KB

english, 2005

32

[IEEE 2014 IEEE International Symposium on Electromagnetic Compatibility - EMC 2014 - Raleigh, NC, USA (2014.8.4-2014.8.8)] 2014 IEEE International Symposium on Electromagnetic Compatibility (EMC) - A new tail-fit method design for jitter decomposition

Sui, Chunchun, Beetner, Daryl G., Zhu, Ting, Cheng, Christopher

Year:

2014

Language:

english

File:

PDF, 1.11 MB

english, 2014

33

[IEEE 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Portland, OR, USA (2006.08.14-2006.08.18)] 2006 IEEE International Symposium on Electromagnetic Compatibility, 2006. EMC 2006. - Quantifying electric and magnetic field coupling from integrated circuits with TEM cell measurements

Kasturi, V., Deng, S., Hubing, T., Beetner, D.

Year:

2006

Language:

english

File:

PDF, 393 KB

english, 2006

34

[IEEE 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Taipei, Taiwan (2015.5.26-2015.5.29)] 2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC) - Prediction of radiated emissions from cables with multiple connections to a metal plane

Li, Guanghua, Hess, Gary, Hoeckele, Robert, Jalbert, Pete, Khilkevich, Victor, Van Doren, Thomas, Pommerenke, David, Beetner, Daryl

Year:

2015

Language:

english

File:

PDF, 609 KB

english, 2015

35

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, Il, USA (8-12 Aug. 2005)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Estimation of current from near-field measurement

Haixiao Weng,, Beetner, D.G., DuBroff, R.E., Jin Shi,

Year:

2005

Language:

english

File:

PDF, 752 KB

english, 2005

36

[IEEE 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Chicago, IL, USA (2005.08.12-2005.08.12)] 2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. - Determination of high frequency package currents from near-field scan data

Xiaopeng Dong,, Shaowei Deng,, Beetner, D.G., Hubing, T.H., Van Doren, T.P.

Year:

2005

File:

PDF, 79 KB

2005

37

[IEEE 2016 IEEE International Symposium on Electromagnetic Compatibility - EMC 2016 - Ottawa, ON, Canada (2016.7.25-2016.7.29)] 2016 IEEE International Symposium on Electromagnetic Compatibility (EMC) - Study of alien crosstalk to a BroadR-Reach® protocol based system

Makharashvili, Tamar, Booth, Brian, Martin, Kerry, Drewniak, James, Beetner, Daryl G.

Year:

2016

Language:

english

File:

PDF, 1.16 MB

english, 2016

38

[IEEE 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Washington, DC, USA (2017.8.7-2017.8.11)] 2017 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - An on-chip detector of transient stress events

Patnaik, A., Suchak, M., Seva, R., Pamidimukkala, K., Pommerenke, D., Edgington, G., Moseley, R., Feddeler, J., Stockinger, M., Beetner, D.

Year:

2017

Language:

english

File:

PDF, 1.58 MB

english, 2017

39

[IEEE 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - San Jose, CA, USA (2018.10.14-2018.10.17)] 2018 IEEE 27th Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS) - Inductance Models of 8-Terminal Decoupling Capacitors

Makharashvili, T., Bai, S., Cecchini, M., Ruehli, A. E., Berger, P., Drewniak, J., Beetner, D. G.

Year:

2018

Language:

english

File:

PDF, 944 KB

english, 2018

40

[IEEE 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) - New Orleans, LA, USA (2019.7.22-2019.7.26)] 2019 IEEE International Symposium on Electromagnetic Compatibility, Signal & Power Integrity (EMC+SIPI) - Experimental Validation of an Integrated Circuit Transient Electromagnetic Event Sensor

Marathe, Shubhankar, Patnaik, Abhishek, Ghosh, Kaustav, Kim, Jingook, Pommerenke, David, Beetner, Daryl G.

Year:

2019

Language:

english

File:

PDF, 723 KB

english, 2019

41

Accurate Inductance Models of Mounted Two-Terminal Decoupling Capacitors

Makharashvili, Tamar, Bai, Siqi, Maghlakelidze, Giorgi, Connor, Samuel, Ruehli, Albert E., Berger, Phil, Drewniak, James L., Beetner, Daryl G.

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2020

File:

PDF, 2.68 MB

2020

42

Source Reconstruction in Near-Field Scanning Using Inverse MoM for RFI Application

Rezaei, Hossein, Meiguni, Javad Soleiman, Sorensen, Morten, Jobava, Roman G., Khilkevich, Victor, Fan, Jun, Beetner, Daryl G., Pommerenke, David

Journal:

IEEE Transactions on Electromagnetic Compatibility

Year:

2020

File:

PDF, 4.16 MB

2020

43

[IEEE 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Reno, NV, USA (2020.7.28-2020.8.28)] 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Direct Measurement and Representation of Common-mode Sources in Cable Harnesses

Walunj, Sameer, Makharashvili, Tamar, Hwang, Chulsoon, Beetner, Daryl, Booth, Brian, Martin, Kerry

Year:

2020

File:

PDF, 285 KB

2020

44

[IEEE 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Reno, NV, USA (2020.7.28-2020.8.28)] 2020 IEEE International Symposium on Electromagnetic Compatibility & Signal/Power Integrity (EMCSI) - Experimental characterization and methodology for full-wave modeling of ESD to displays

Rezaei, Hossein, Peng, Zhekun, Marathe, Shubhankar, Pommerenke, David, Lam, Cheung Wei, Foudazi, Ali, Beetner, Daryl, Kim, DongHyun

Year:

2020

File:

PDF, 748 KB

2020

45

DEGRADATION OF THIAMINE AND RIBOFLAVIN DURING EXTRUSION PROCESSING

G. BEETNER, T. TSAO, A. FREY, J. HARPER

Journal:

Journal of Food Science

Year:

1974

Language:

english

File:

PDF, 186 KB

english, 1974

46

EXTRUSION PROCESSING OF TRITICALE

K. LORENZ, J. WELSH, R. NORMANN, G. BEETNER, A. FREY

Journal:

Journal of Food Science

Year:

1974

Language:

english

File:

PDF, 514 KB

english, 1974

47

Direct Inference of the Spectra of Pericardial Potentials Using the Boundary-Element Method

Daryl G. Beetner, R. Martin Arthur

Journal:

Annals of Biomedical Engineering

Year:

1999

Language:

english

File:

PDF, 510 KB

english, 1999

48

Chain mechanism for exchange of D2 with a ruthenium hydride

Casey, Charles P., Johnson, Jeffrey B., Jiao, Xiandong, Beetner, Sharon E., Singer, Steven W.

Journal:

Chemical Communications

Year:

2010

Language:

english

File:

PDF, 1.66 MB

english, 2010

49

Improved inference of heart potentials using the multipole-equivalent method

R. Martin Arthur, Daryl G. Beetner

Journal:

Journal of Electrocardiology

Year:

2000

Language:

english

File:

PDF, 122 KB

english, 2000

50

Improved estimation of pericardial potentials from body-surface maps using individualized torso models

R.Martin Arthur, Daryl G Beetner, H.Dieter Ambos, Michael E Cain

Journal:

Journal of Electrocardiology

Year:

1998

Language:

english

File:

PDF, 666 KB

english, 1998

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